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Manuscript Title: IonRock: software for solving strain gradients of ion-implanted semiconductors by X-ray diffraction measurements and evolutionary programming
Authors: L. Bleicher, J. M. Sasaki, R. V. Orloski, L. P. Cardoso, M. A. Hayashi, J. W. Swart
Program title: IonRock, version 1.0
Catalogue identifier: ADTP_v1_0
Distribution format: tar.gz
Journal reference: Comput. Phys. Commun. 160(2004)158
Programming language: C++.
Computer: any computer with Windows95 or later version.
Operating system: Windows95/98/2000/NT/XP.
RAM: about 4 MB
Keywords: X-ray diffraction, Ion implantation, Genetic algorithms.
PACS: 61.10, 61.72.T, 61.72.V.
Classification: 8.

Nature of problem:
Strain determination on ion implanted zinc-blend structure semiconductors

Solution method:
Adapted version of the Genetic Algorithm meta-heuristic

Strain determination is related to the strain generated by interstitial ions, which causes the left-side distortions on the rocking curve

Running time:
On an Athlon PC computer the computing time for solving the strain gradient using 16 layers takes from 10 to 30 minutes