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Manuscript Title: ELLIPS: a Fortran simulation of a polarization-modulation ellipsometer.
Authors: V.M. Bermudez
Program title: ELLIPS
Catalogue identifier: ACXK_v1_0
Distribution format: gz
Journal reference: Comput. Phys. Commun. 13(1977)207
Programming language: Fortran.
Computer: TEXAS INSTRUMENTS ASC II.
Operating system: O/S 4.021.
RAM: 21K words
Word size: 32
Keywords: Optics, Ellipsometry, Jones matrices, Polarization modulation, Error analysis.
Classification: 18.

Nature of problem:
The problem treated is the analysis of the effect, on the detected AC signals, of imperfections in and misalignment of the optical components of a polarization-modulation ellipsometer. This permits correction of the values of psi and delta (characteristics of the sample surface) for systematic error, estimation of the uncertainty in the final result, and identification of the most significant sources of experimental error.

Solution method:
The transmitted amplitude vector is computer using the Jones matrices of the individual components. The modified Jones matrices introduced by O'Handley are used to separate the DC and AC components of the detected intensity.

Running time:
1.4 sec for one datum point (systematic error correction with 5 iterations + complete calculations of experimental uncertainty). 0.3 sec for uncertainty calculation only.